High Frequency Electric Field Probe Kit for EMI & EMC Near-Field Testing

This High Frequency Electric Field Probe Kit is engineered for precise near-field E-field measurements across a wide 30MHz to 3GHz frequency range, making it ideal for EMI diagnostics, EMC pre-compliance testing, and RF interference analysis.

The probe set includes two specialised electric field probe geometries, each optimised for detecting radiated and conducted electric field noise at close proximity to electronic components, PCB traces, cables, and enclosures. These probes allow engineers to quickly identify which circuit, component, or coupling path is responsible for excessive electromagnetic emissions.

Designed as passive near-field probes, the system connects directly to oscilloscopes, spectrum analysers, or EMI receivers via a 50-ohm RF interface, enabling real-time signal observation without complex setup. When analysing weak interference signals, the probes can be paired with an external RF pre-amplifier to significantly improve measurement sensitivity.

This kit is widely used in RF design, switching power supply analysis, high-speed digital systems, wireless device development, and industrial electronics, helping reduce development time and prevent costly compliance failures.

Key Applications (SEO Keywords Included)

• EMI & EMC troubleshooting

• High frequency electric field (E-field) measurement

• Near-field RF probing

• EMC pre-compliance testing

• PCB and cable interference detection

• RF noise source identification

• High-speed digital and RF circuit analysis

Key Features

• High frequency electric field (E-field) probe kit

• Frequency range: 30MHz – 3GHz

• Passive near-field probe design

• Two probe head geometries for different test scenarios

• Direct connection to oscilloscopes and spectrum analysers

• 50Ω impedance for accurate RF measurements

• Compatible with optional RF pre-amplifier for weak signals

• Ideal for EMC diagnostics and RF troubleshooting